PolishEM: image enhancement in FIB–SEM

Abstract

Abstract Summary We have developed a software tool to improve the image quality in focused ion beam–scanning electron microscopy (FIB–SEM) stacks: PolishEM. Based on a Gaussian blur model, it automatically estimates and compensates for the blur affecting each individual image. It also includes correction for artifacts commonly arising in FIB–SEM (e.g. curtaining). PolishEM has been optimized for an efficient processing of huge FIB–SEM stacks on standard computers. Availability and implementation PolishEM has been developed in C. GPL source code and binaries for Linux, OSX and Windows are available at http://www.cnb.csic.es/%7ejjfernandez/polishem. Supplementary information Supplementary data are available at Bioinformatics online.