Economic Injury Level Model for Tarnished Plant Bug, Lygus lineolaris (Palisot de Beauvois) (Hemiptera: Miridae), in Strawberry Fields-Reference-Cited by-同舟云学术

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Economic Injury Level Model for Tarnished Plant Bug, Lygus lineolaris (Palisot de Beauvois) (Hemiptera: Miridae), in Strawberry Fields

Published:1988-06-01 Issue:3 Volume:17 Page:581-586
ISSN:1938-2936
Container-title:Environmental Entomology
language:en
Short-container-title:

Author:

Mailloux G.,Bostanian N. J.

Publisher

Oxford University Press (OUP)

Subject

Insect Science,Ecology,Ecology, Evolution, Behavior and Systematics

Link

http://academic.oup.com/ee/article-pdf/17/3/581/18282989/ee17-0581.pdf

Cited by 30 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A chromosome scale assembly of the tarnished plant bug, Lygus lineolaris (Palisot de Beauvois), genome;BMC Research Notes;2023-06-27

2. A Chromosome scale assembly of the tarnished plant bug, Lygus lineolaris (Palisot de Beauvois), genome;2023-05-05

3. DNA Metabarcoding-Based Evaluation of the Diet of Big Brown Bats (Eptesicus fuscus) in the Mid-Atlantic Region;Northeastern Naturalist;2023-01-10

4. Predicting Phenology of Four Major Hemipteran Pests to Enhance Integrated Pest Management Programs in Potatoes in the Lower Columbia Basin;Journal of Economic Entomology;2022-01-24

5. Lygus lineolaris (tarnished plant bug);CABI Compendium;2022-01-07

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