A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking-Reference-Cited by-同舟云学术

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A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:1754-1755
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Peters Jonathan J P¹²³,Reed Bryan W⁴,Jimbo Yu⁵,Porter Alexandra⁶,Masiel Daniel⁴,Jones Lewys¹²³

Affiliation:

1. Advanced Microscopy Laboratory , CRANN, Dublin , Ireland

2. School of Physics, Trinity College Dublin , Dublin , Ireland

3. turboTEM Ltd. , Dublin , Ireland

4. Integrated Dynamic Electron Systems Inc. , Pleasanton, California , USA

5. JEOL Ltd. , Akishima, Tokyo , Japan

6. Imperial College London , London , United Kingdom

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/1754/50935096/ozad067.907.pdf

Reference4 articles.

1. Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM

2. Electrostatic Switching for Spatiotemporal Dose Control in a Transmission Electron Microscope

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Diffusion distribution model for damage mitigation in scanning transmission electron microscopy;Journal of Microscopy;2024-08-21

2. Event-Responsive Beam-Modulated STEM with Multi-Frame and Sparse Scanning;Microscopy and Microanalysis;2024-07

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