Event-Responsive Beam-Modulated STEM with Multi-Frame and Sparse Scanning-Reference-Cited by-同舟云学术

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Event-Responsive Beam-Modulated STEM with Multi-Frame and Sparse Scanning

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Mosse Matthew¹²,Peters Jonathan J P¹²³,Reed Bryan W⁴,Masiel Daniel J⁴,Conroy Michele⁵,Jones Lewys¹²³

Affiliation:

1. Advanced Microscopy Laboratory (CRANN), Trinity College Dublin , Dublin , Ireland

2. School of Physics, Trinity College Dublin , Dublin , Ireland

3. turboTEM Limited , Dublin , Ireland

4. Integrated Dynamic Electron Solutions , Pleasanton CA , USA

5. Department of Materials, London Centre of Nanotechnology, Imperial Henry Royce Institute, Imperial College London , London , UK

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.191/58670456/ozae044.191.pdf

Reference4 articles.

1. Electron counting detectors in scanning transmission electron microscopy via hardware signal processing

2. Electrostatic Switching for Spatiotemporal Dose Control in a Transmission Electron Microscope

3. A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking

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