Convolution Neural Networks and Position Averaged Convergent Beam Electron Diffraction for Determining the Structure of 2D Materials-Reference-Cited by-同舟云学术

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Convolution Neural Networks and Position Averaged Convergent Beam Electron Diffraction for Determining the Structure of 2D Materials

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:691-693
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Yankovich Andrew B¹,Röding Magnus²³,Skärström Victor Wåhlstrand⁴,Ranjan Alok¹,Olsson Eva¹

Affiliation:

1. Department of Physics, Chalmers University of Technology , Göteborg , Sweden

2. RISE Research Institutes of Sweden , Bioeconomy and Health, Agriculture and Food, Göteborg , Sweden

3. Department of Mathematical Sciences, Chalmers University of Technology and University of Gothenburg , Göteborg , Sweden

4. Department of Electrical Engineering, Chalmers University of Technology , Göteborg , Sweden

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/691/50932854/ozad067.341.pdf

Reference8 articles.

1. Position averaged convergent beam electron diffraction: Theory and applications

2. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

3. Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric

4. Nanoscale quantification of octahedral tilts in perovskite films

5. A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multiscale computational modeling techniques in study and design of 2D materials: recent advances, challenges, and opportunities;2D Materials;2024-09-09

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