Position averaged convergent beam electron diffraction: Theory and applications-Reference-Cited by-同舟云学术

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Position averaged convergent beam electron diffraction: Theory and applications

Published:2010-01 Issue:2 Volume:110 Page:118-125
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

LeBeau James M.,Findlay Scott D.,Allen Leslie J.,Stemmer Susanne

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, New York, 1996).

2. EELS log-ratio technique for specimen-thickness measurement in the TEM

3. Separation of bulk and surface-losses in low-loss EELS measurements in STEM

4. Quantitative Atomic Resolution Scanning Transmission Electron Microscopy

5. Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope

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