An Improved Average Atomic Number Calculation for Estimating Backscatter and Continuum Production in Compounds

Author:

Donovan John1ORCID,Ducharme Andrew2ORCID,Schwab Joseph J2,Moy Aurélien3,Gainsforth Zack4ORCID,Wade Benjamin5,McMorran Benjamin2ORCID

Affiliation:

1. CAMCOR, University of Oregon , 1443 East 13th Ave., Eugene, OR 97403 , USA

2. Department of Physics, University of Oregon, 1371 East 13th Ave., Eugene, OR 97403 , USA

3. Geoscience Department, University of Wisconsin-Madison , 1215 W Dayton St, Madison, WI 53706 , USA

4. Space Sciences Laboratory, Univ. of California at Berkeley , 7 Gauss Way, Berkeley, CA 94720 , USA

5. Adelaide Microscopy, The University of Adelaide , NG13, Frome Road, Adelaide, SA 5005 , Australia

Abstract

Abstract It is often assumed that electron backscatter and continuum (bremsstrahlung) productions emitted from electron-solid interactions during X-ray microanalysis in compounds can be extrapolated from pure element observations by means of the assumption of average atomic number, or Z-bar (Z¯). For pure elements the average Z is equal to the atomic number, but this direct approach fails for compounds. The use of simple atomic fractions yields completely spurious results, and while the commonly used mass fraction Z averaging produces fairly reasonable results, we know from physical considerations that the mass of the neutron plays only a negligible role in such interactions below ∼1 MeV. Therefore, including the mass or atomic weight in such calculations can only introduce further errors in these models. We present an expression utilizing atomic fractions of the atomic numbers of the elements in the compound (Z fraction), with an exponent to account for the variation in nuclear screening as a function of the element Z value.

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Considerations for Determining Duane-Hunt Limits on Electron Beam Instruments;Microscopy and Microanalysis;2024-07

2. Enhanced Electron Backscatter Correction for Electron Probe Microanalysis;Microscopy and Microanalysis;2024-07

3. Electron microprobe dating of lunar zirconolite;Journal of Analytical Science and Technology;2024-03-29

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