How Fast is Your Detector? The Effect of Temporal Response on Image Quality

Author:

Mullarkey Tiarnan12ORCID,Geever Matthew1ORCID,Peters Jonathan J P1ORCID,Griffiths Ian3,Nellist Peter D3ORCID,Jones Lewys14ORCID

Affiliation:

1. School of Physics, Trinity College Dublin, College Green , Dublin D02 PN40 , Ireland

2. Centre for Doctoral Training in the Advanced Characterisation of Materials, AMBER Centre, Trinity College Dublin , Dublin D02 PN40 , Ireland

3. Department of Materials, University of Oxford , Parks Road, Oxford OX1 3PH , UK

4. Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin , Dublin D02 PN40 , Ireland

Abstract

Abstract With increasing interest in high-speed imaging, there should be an increased interest in the response times of our scanning transmission electron microscope detectors. Previous works have highlighted and contrasted the performance of various detectors for quantitative compositional or structural studies, but here, we shift the focus to detector temporal response, and the effect this has on captured images. The rise and decay times of eight detectors' single-electron response are reported, as well as measurements of their flatness, roundness, smoothness, and ellipticity. We develop and apply a methodology for incorporating the temporal detector response into simulations, showing that a loss of resolution is apparent in both the images and their Fourier transforms. We conclude that the solid-state detector outperforms the photomultiplier tube–based detectors in all areas bar a slightly less elliptical central hole and is likely the best detector to use for the majority of applications. However, using the tools introduced here, we encourage users to effectively evaluate which detector is most suitable for their experimental needs.

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Reference33 articles.

1. Scintillation properties of YAP:Ce;Baccaro;Nucl Instr Methods Phys Res Sect A: Accel Spectrom Detect Assoc Equip,1995

2. High-resolution low-dose scanning transmission electron microscopy;Buban;J Electron Microsc (Tokyo),2010

3. EROIC: A BiCMOS pseudo-Gaussian shaping amplifier for high-resolution X-ray spectroscopy;Buzzetti;Nucl Instrum Methods Phys Res Sect A: Accel Spectrom Detect Assoc Equip,2003

4. Quantitative annular dark-field imaging in the scanning transmission electron microscope—A review;Dwyer;J Phys: Mater,2021

5. Radiation damage to organic and inorganic specimens in the TEM;Egerton;Micron,2019

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