Integrating APT on TEM: Everything You’ve Always Wanted to Know about a Cubic Micron, but Were Afraid to Ask-Reference-Cited by-同舟云学术

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Integrating APT on TEM: Everything You’ve Always Wanted to Know about a Cubic Micron, but Were Afraid to Ask

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:587-588
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

van Leeuwen Hugo¹,Kujawa Stephan¹,Dona Pleun¹,Persoon Hans¹,Smit Casper¹,van den Boogaard Ron¹,Bunton Joe²,Lenz Dan²,Bogers Maurice³,Ruinemans Erik³,Rodriguez Nestor Hernandez¹,Gramza Marcin¹,Hoovinakatte Naren¹,van Lin Hans¹,Hoogeveen Jos¹,Manzke Russ²,Shephard Jeff²,Franssen Robin³,Cappa Steven³

Affiliation:

1. ThermoFisher Scientific, TEM Solutions , Eindhoven, Noord-Brabant , The Netherlands

2. CAMECA Instruments Inc, Atom Probe Tomography , Madison, Wisconsin , USA

3. MI-Partners, Mechatronics Innovations, Veldhoven , Noord-Brabant , The Netherlands

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/587/50931776/ozad067.283.pdf

Reference3 articles.

1. Towards quantitative off-axis electron holographic mapping of the electric field around the tip of a sharp biased metallic needle

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