Towards quantitative off-axis electron holographic mapping of the electric field around the tip of a sharp biased metallic needle-Reference-Cited by-同舟云学术

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Towards quantitative off-axis electron holographic mapping of the electric field around the tip of a sharp biased metallic needle

Published:2014-07-14 Issue:2 Volume:116 Page:024305
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Beleggia M.¹²,Kasama T.¹,Larson D. J.³,Kelly T. F.³,Dunin-Borkowski R. E.⁴,Pozzi G.⁵

Affiliation:

1. Center for Electron Nanoscopy, Technical University of Denmark, Kongens Lyngby, Denmark

2. Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany

3. CAMECA Instruments, Inc., Madison, Wisconsin 53711, USA

4. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungzentrum Jülich, Jülich, Germany

5. Department of Physics and Astronomy, University of Bologna, Bologna, Italy

Funder

European Commission (EC)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4887448

Reference43 articles.

1. Novel approaches for the characterization of electromagnetic fields using electron holography

2. Local electrostatic effects of surface structure on field emission

3. Atom probe tomography

4. Atomic-Scale Tomography: A 2020 Vision

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1. Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holography;Ultramicroscopy;2023-11

2. Comparing Methodologies for Achieving Atomic-Scale Tomography;Microscopy and Microanalysis;2023-07-22

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4. Nanoscale Three-Dimensional Charge Density and Electric Field Mapping by Electron Holographic Tomography;Nano Letters;2023-01-23

5. Electron-beam-induced charging of an Al2O3 nanotip studied using off-axis electron holography;Ultramicroscopy;2022-11

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