High-Fidelity 3D Imaging Achieved Through Multislice Electron Tomography Using 4D-STEM-Reference-Cited by-同舟云学术

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High-Fidelity 3D Imaging Achieved Through Multislice Electron Tomography Using 4D-STEM

Published:2023-07-22 Issue:Supplement_1 Volume:29 Page:1388-1389
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Lee Juhyeok¹,Lee Moosung¹²,Park YongKeun¹²³,Ophus Colin⁴,Yang Yongsoo¹

Affiliation:

1. Department of Physics, Korea Advanced Institute of Science and Technology (KAIST) , Daejeon , Korea

2. KAIST Institute for Health Science and Technology , Daejeon , Korea

3. Tomocube, Inc. , Daejeon , Korea

4. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory , Berkeley, California , United States

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

https://academic.oup.com/mam/article-pdf/29/Supplement_1/1388/50934094/ozad067.714.pdf

Reference15 articles.

1. Three-dimensional atomic imaging of crystalline nanoparticles

2. Three-dimensional coordinates of individual atoms in materials revealed by electron tomography

3. Deciphering chemical order/disorder and material properties at the single-atom level

4. Observing crystal nucleation in four dimensions using atomic electron tomography

5. Correlating the three-dimensional atomic defects and electronic properties of two-dimensional transition metal dichalcogenides

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