Author:
Xu Rui,Chen Chien-Chun,Wu Li,Scott M. C.,Theis W.,Ophus Colin,Bartels Matthias,Yang Yongsoo,Ramezani-Dakhel Hadi,Sawaya Michael R.,Heinz Hendrik,Marks Laurence D.,Ercius Peter,Miao Jianwei
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry
Reference41 articles.
1. Crystallography at 100. Science 343 (Special issue), 1091–1116 (2014).
2. Giacovazzo, C. et al. Fundamentals of Crystallography 2nd edn (Oxford Univ. Press, 2002).
3. Feynman, R. P. in Feynman and Computation (ed. Hey, J. G.) 63–76 (Perseus Press, 1999).
4. Haider, M. et al. Electron microscopy image enhanced. Nature 392, 768–769 (1998).
5. Batson, P. E., Dellby, N. & Krivanek, O. L. Sub-ångstrom resolution using aberration corrected electron optics. Nature 418, 617–620 (2002).
Cited by
178 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献