Low-temperature tunnelling-electron luminescence microscopy using tip collection
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/46/3/199/3324142/46-3-199.pdf
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Scanning tunneling microscope based nanoscale optical imaging of molecules on surfaces;Japanese Journal of Applied Physics;2015-06-05
2. Conductive transparent fiber probes for shear-force atomic force microscopes;Ultramicroscopy;2006-01
3. Transparent and conductive Sb-doped tin oxide SPM tips prepared by sol–gel method;Materials Science and Engineering: C;2002-01
4. Direct measurement of sub-10 nm-level lateral distribution in tunneling-electron luminescence intensity on a cross-sectional 50-nm-thick AlAs layer by using a conductive transparent tip;Applied Physics Letters;2001-06-18
5. Optical system for tunneling-electron luminescence spectro/microscopes with conductive-transparent tips in ultrahigh vacuums;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1999
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