Conductive transparent fiber probes for shear-force atomic force microscopes
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Novel conductive transparent tip for low-temperature tunneling-electron luminescence microscopy using tip collection
2. Low-temperature tunnelling-electron luminescence microscopy using tip collection
3. Direct measurement of sub-10 nm-level lateral distribution in tunneling-electron luminescence intensity on a cross-sectional 50-nm-thick AlAs layer by using a conductive transparent tip
4. Combined shear force and near‐field scanning optical microscopy
5. Correlative imaging in scanning near‐field optical microscopy
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