A simple technique for the estimation of the voltage of a transmission electron microscope
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/57/4/119/5851570/dfn009.pdf
Reference7 articles.
1. Application of convergent-beam illumination methods to the study of lattice distortion across the interface
2. Measurement of low-order structure factors for silicon from zone-axis CBED patterns
3. A practical simulated annealing program and its application to quantitative CBED pattern matching
4. Voltage refinement by deficit HOLZ line geometry
5. Accurate determination of the voltage of a transmission electron microscope (TEM) by 〈0 1 2〉 CBED-HOLZ analyses using GaAs crystal
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