Measurement of low-order structure factors for silicon from zone-axis CBED patterns-Reference-Cited by-同舟云学术

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Measurement of low-order structure factors for silicon from zone-axis CBED patterns

Published:1995-09 Issue:2 Volume:60 Page:311-323
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Saunders M,Bird D.M,Zaluzec N.J,Burgess W.G,Preston A.R,Humphreys C.J

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Sensitivity and accuracy of CBED pattern matching

2. Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction

3. Structure factor determination in non-centrosymmetric crystals by a two-dimensional CBED-based multi-parameter refinement method

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