Secondary electron effect on electron beam induced charging of SiO2particle analyzed by electron holography-Reference-Cited by-同舟云学术

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Secondary electron effect on electron beam induced charging of SiO2particle analyzed by electron holography

Published:2017-01-17 Issue: Volume: Page:
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Suzuki Hiroaki,Akase Zentaro,Niitsu Kodai,Tanigaki Toshiaki,Shindo Daisuke

Funder

Japan Society for the Promotion of Science (JSPS)

Kakenhi Grant-in-Aid

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/66/3/167/17633540/dfw112.pdf

Reference12 articles.

1. Characterization of charging in semiconductor device materials by electron holography

2. Electron holography of charging effect in ZrO2 sintered body;Kim;Mater. Trans.,2007

3. Interpretation of electron beam induced charging of oxide layers in a transistor studied using electron holography;Ubaldi;J. Phys. Conf. Ser.,2010

4. Counting elementary charges on nanoparticles by electron holography;Gatel;Phys. Rev. Lett.,2013

5. Sputter coating techniques for scanning electron microscopy;Echlin;Scanning Electron Microsc,1975

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1. Electron holography observation of electron spin polarization around charged insulating wire;Microscopy;2023-11-11

2. Electrostatic potential measurement at the Pt/TiO2 interface using electron holography;Journal of Applied Physics;2021-05-07

3. Direct observation of electric and magnetic fields of functional materials;Materials Science and Engineering: R: Reports;2020-10

4. Phase detection limits in off-axis electron holography from pixelated detectors: gain variations, geometric distortion and failure of reference-hologram correction;Microscopy;2020-08-03

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