Quantitative analysis of angle-selective backscattering electron image of iron oxide and steel

Author:

Aoyama Tomohiro,Nagoshi Masayasu,Sato Kaoru

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Reference19 articles.

1. Niedrig H (1982) Analytical models in electron backscattering. In: Kyser D F , Niedrig H , Newbury D E , Shimizu R (eds), Electron Beam Interaction with Solids for Microscopy, Microanalysis & Microlithography, pp. 51–68 (Scanning Electron Microscopy Inc., AMF O'Hare).

2. Electron backscattering from thin films

3. Newbury D E , Joy D C , Echlin P , Charles E F , Goldstein J I (1986) Advanced Scanning Electron Microscopy and X-ray Microanalysis. (Plenum Press, New York).

4. Backscattered electron imaging using single crystal scintillator detector;Autrata;Scanning Microsc.,1989

5. Reimer L (1993) Image Formation in Low-Voltage Scanning Electron Microscopy, (SPIE Press, Bellingham).

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