Calculation of integrated intensities in aberration-corrected Z-contrast images
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/60/1/29/5854065/dfq078.pdf
Reference16 articles.
1. High-Resolution Transmission Electron Microscopy on an Absolute Contrast Scale
2. High-resolution incoherent imaging of crystals
3. MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE
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