Model-based deconvolution for particle analysis applied to a through-focus series of HAADF-STEM images
Author:
Affiliation:
1. Materials Analysis & Evaluation Research-Domain, Toyota Central R&D Labs., Co. Ltd , 41-1, Yokomichi, Nagakute, Aichi 480-1192, Japan
Abstract
Publisher
Oxford University Press (OUP)
Subject
Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology
Link
https://academic.oup.com/jmicro/advance-article-pdf/doi/10.1093/jmicro/dfac070/48616885/dfac070.pdf
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4. Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage;Suenaga;Nat. Chem.,2009
5. Detection of photons emitted from single erbium atoms in energy-dispersive X-ray spectroscopy;Suenaga;Nat. Photonics,2012
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