A new grating X-ray spectrometer for 2–4 keV enabling a separate observation of In-Lβ and Sn-Lα emissions of indium tin oxide-Reference-Cited by-同舟云学术

A new grating X-ray spectrometer for 2–4 keV enabling a separate observation of In-Lβ and Sn-Lα emissions of indium tin oxide

Published:2013-01-10 Issue:3 Volume:62 Page:391-395
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Terauchi Masami,Takahashi Hideyuki,Handa Nobuo,Murano Takanori,Koike Masato,Kawachi Tetsuya,Imazono Takashi,Hasegawa Noboru,Koeda Masaru,Nagano Tetsuya,Sasai Hiroyuki,Oue Yuki,Yonezawa Zeno,Kuramoto Satoshi

Publisher

Oxford University Press (OUP)

Subject

Radiology Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/62/3/391/11762420/dfs129.pdf

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4. Ultrasoft-X-ray emission spectroscopy using a newly designed wavelength-dispersive spectrometer attached to a transmission electron microscope

5. A new WDS spectrometer for valence electron spectroscopy based on electron microscopy;Terauchi;JEOL News,2012

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