Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy-Reference-Cited by-同舟云学术

Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopes--an introduction of valence electron spectroscopy for transmission electron microscopy

Published:2010-04-05 Issue:4 Volume:59 Page:251-261
ISSN:0022-0744
Container-title:Journal of Electron Microscopy
language:en
Short-container-title:Journal of Electron Microscopy

Author:

Terauchi M.,Koike M.,Fukushima K.,Kimura A.

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

Link

http://academic.oup.com/jmicro/article-pdf/59/4/251/5855588/dfq010.pdf

Reference23 articles.

1. Resonant inelastic x-ray scattering spectra for electrons in solids

2. TheLX-Ray Spectrum of Solid Aluminum

3. Electronic Band Structure of Solids by X-Ray Spectroscopy

4. Soft X-Ray Emission Spectra of Light Elements. I. Li, Be, B, Al and Si

5. Solid-State Energy-Dispersion Spectrometer for Electron-Microprobe X-ray Analysis

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