Evaluation of residual aberration in fifth-order geometrical aberration correctors-Reference-Cited by-同舟云学术

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Evaluation of residual aberration in fifth-order geometrical aberration correctors

Published:2018-02-21 Issue:3 Volume:67 Page:156-163
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:

Author:

Morishita Shigeyuki¹,Kohno Yuji¹,Hosokawa Fumio²,Suenaga Kazu³,Sawada Hidetaka¹

Affiliation:

1. JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan

2. BioNet Laboratory Inc., 2-3-28 Nishiki-chou, Tachikawa, Tokyo 190-0022, Japan

3. National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan

Funder

Japan Science and Technology Agency

Publisher

Oxford University Press (OUP)

Subject

Radiology Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/67/3/156/25094459/dfy009.pdf

Reference21 articles.

1. Electron microscopy image enhanced;Haider;Nature,1998

2. Atomic-resolution imaging with a sub-50-pm electron probe;Erni;Phys. Rev. Lett.,2009

3. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun;Sawada;J. Electron Microsc.,2009

4. Resolving 45-pm-separated Si-Si atomic columns with an aberration-corrected STEM;Sawada;Microscopy,2015

5. Aberration-corrected STEM/TEM imaging at 15 kV;Sasaki;Ultramicroscopy,2014

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