Local symmetry breaking of a thin crystal structure of -Si3N4 as revealed by spherical aberration corrected high-resolution transmission electron microscopy images
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/61/3/145/5854286/dfs038.pdf
Reference20 articles.
1. Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy
2. Atomic resolution improvement by a new method using the second derivative of the intensity function of the reconstructed exit wave of electrons for a thin β-Si3N4 crystal
3. Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy Using Hardware Aberration Correction
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1. Impurity Oxygen-Triggered α- → β-Si3N4 Phase Transformation at 1900 °C;Crystals;2023-11-06
2. Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples;Advanced Structural and Chemical Imaging;2016-11-30
3. Observation of the atomic structure of ß′-SiAlON using three generations of high resolution electron microscopes;Philosophical Magazine;2013-04
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