Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy-Reference-Cited by-同舟云学术

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Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy

Published:2013-05-14 Issue:5 Volume:62 Page:521-531
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:Microscopy (Tokyo)

Author:

Oshima Yoshifumi,Nishi Ryuji,Asayama Kyoichiro,Arakawa Kazuto,Yoshida Kiyokazu,Sakata Takao,Taguchi Eiji,Yasuda Hidehiro

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/62/5/521/5854894/dft031.pdf

Reference24 articles.

1. Some Applications of an Ultra-High Voltage Electron Microscope on Materials Science

2. Topics in recent studies with high-voltage electron microscopes

3. High-Voltage Electron Tomography of Spindle Pole Bodies and Early Mitotic Spindles in the YeastSaccharomyces cerevisiae

4. Correlated 3D Light and Electron Microscopy: Use of High Voltage Electron Microscopy and Electron Tomography for Imaging Large Biological Structures

5. A cell-centered database for electron tomographic data

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1. Advances in Characterization of Thick Specimens and Time-Resolved <i>In-situ</i> Observation by Modern High Voltage Electron Microscopy;Materia Japan;2024-04-01

2. Transmission electron microscopy of thick polymer and biological specimens;Micron;2023-06

3. Application of ultra‐high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells;Journal of Microscopy;2020-04

4. High-Voltage Scanning Transmission Electron Microscopy: A Tool for Structural Characterization of Micrometer-Thick Specimens;MATERIALS TRANSACTIONS;2019-05-01

5. Empirical determination of transmission attenuation curves in mass–thickness contrast TEM imaging;Ultramicroscopy;2019-05

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