Instrument Optimization of a High-Energy Electron Energy-loss Spectrometry System in an Aberration-Corrected Scanning Transmission Electron Microscope-Reference-Cited by-同舟云学术

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Instrument Optimization of a High-Energy Electron Energy-loss Spectrometry System in an Aberration-Corrected Scanning Transmission Electron Microscope

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Watanabe Masashi¹²,Campos-Quiros Alexander¹,Guzzinati Giulio³,Kükelhan Pirmin³,Gerheim Volker³,Linck Martin³,Müller Heiko³,Haider Max³,Hoffman Thomas F⁴,Sakaguchi Kotaro⁴,Mukai Masaki⁵,Isabell Thomas⁴,Shimura Naoki⁴,Sawada Hidetaka⁴⁶

Affiliation:

1. Department of Materials Science and Engineering, Lehigh University , Bethlehem, PA , United States

2. Institute for Materials Research, Tohoku University , Sendai, Miyagi , Japan

3. CEOS GmbH , Heidelberg , Germany

4. JEOL USA , Peabody, MA , United States

5. JEOL Germany GmbH , Freising , Germany

6. JEOL Ltd , Akishima, Tokyo , Japan

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.685/58640095/ozae044.685.pdf

Reference4 articles.

1. Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling

2. A transmission electron microscope (TEM) calibration standard sample for all magnification, camera constant, and image/diffraction pattern rotation calibrations

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