A transmission electron microscope (TEM) calibration standard sample for all magnification, camera constant, and image/diffraction pattern rotation calibrations-Reference-Cited by-同舟云学术

A transmission electron microscope (TEM) calibration standard sample for all magnification, camera constant, and image/diffraction pattern rotation calibrations

Published:1995-12-01 Issue:5 Volume:32 Page:449-454
ISSN:1059-910X
Container-title:Microscopy Research and Technique
language:en
Short-container-title:Microsc. Res. Tech.

Author:

McCaffrey J. P.,Baribeau J.-M.

Publisher

Wiley

Subject

Medical Laboratory Technology,Instrumentation,Histology,Anatomy

Reference11 articles.

1. Small Spherical Particles of Exceptionally Uniform Size

2. (1976) Practical Electron Microscopy in Materials Science. Van Nostrand Reinhold, New York, pp. 21-30.

3. Strain relaxation kinetics in Si1−xGex/Si heterostructures

4. Improved TEM samples of semiconductors prepared by a small-angle cleavage technique

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