Automated Sample Drift Correction for Low Intensity Electron Counted TEM Images
Author:
Affiliation:
1. Department of Chemistry, York College / CUNY , Jamaica , NY, USA
2. Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, NY , USA
Publisher
Oxford University Press (OUP)
Link
https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.1020/58668404/ozae044.1020.pdf
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5. Enhanced imaging in low dose electron microscopy using electron counting
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