Enhanced imaging in low dose electron microscopy using electron counting
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Image Science;Dainty,1974
2. The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection
3. Optimization of Image Collection for Cellular Electron Microscopy
4. Direct single electron detection with a CMOS detector for electron microscopy
5. Direct electron imaging in electron microscopy with monolithic active pixel sensors
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