Ionospheric density depletions around crustal fields at Mars and their connection to ion frictional heating

Author:

Madanian HadiORCID,Hesse Troy,Duru Firdevs,Pilinski MarcinORCID,Frahm Rudy

Abstract

Abstract. Mars' ionosphere is formed through ionization of the neutral atmosphere by solar irradiance, charge exchange, and electron impact. Observations by the Mars Atmosphere and Volatile EvolutioN (MAVEN) spacecraft have shown a highly dynamic ionospheric layer at Mars impacted by loss processes including ion escape, transport, and electron recombination. The crustal fields at Mars can also significantly modulate the ionosphere. We use MAVEN data to perform a statistical analysis of density depletions of ionospheric species (O+, O2+, and electrons) around crustal fields. Events mostly occur when the crustal magnetic fields are radial, outward, and with a mild preference towards east in the planetocentric coordinates. We show that events near crustal fields are typically accompanied by an increase in suprathermal electrons within the depletion, either throughout the event or as a short-lived electron beam. However, no correlation between the changes in the bulk electron densities and suprathermal electron density variations is observed. Our analysis indicates that the temperature of the major ionospheric species, O2+, increases during most of the density depletion events, which could indicate that some ionospheric density depletions around crustal fields are a result of ion frictional heating.

Funder

National Aeronautics and Space Administration

Publisher

Copernicus GmbH

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3