Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners

Abstract

Abstract. The miniaturisation of components leads to new demands on measurement systems. One of these is the resolution. As a volumetric analysis method and method of non-destructive testing, industrial X-ray computed tomography (XCT) has the ability to measure geometrical features and their corresponding dimensions without destroying them and can therefore be used for quality assurance. However, the concept of resolution is not trivial for XCT and has not yet been finally clarified. In particular, the interface structural resolution, the detectability of two surfaces facing each other after surface segmentation, faces a lack of a test specimen, a corresponding measurand and a reliable method. Simulation-based XCT investigations of a method to determine this type of resolution are presented in this article using the geometry of a test specimen that contains several radially arranged holes of the same size. The borehole diameters correspond to the distance between the holes to investigate the resolvability of surfaces and interfaces. The evaluation is based on mean and extreme values of grey value profiles between the individual boreholes of the reconstructed volume. It is shown that the geometrical detectability of the test specimen surface and interface can be extended by a reasonable choice of the threshold value for surface segmentation within a defined interval. With regard to the resolving capability, a distinction is made between assured detectability and possible detectability, as well as the threshold value used when using the ISO50 threshold for surface segmentation and measurement chain completion.