Determination of the Interface Structural Resolution of an Industrial X-Ray Computed Tomograph Using a Spherical Specimen and a Gap Specimen Consisting of Gauge Blocks

Author:

Busch Matthias1,Hausotte Tino1

Affiliation:

1. Friedrich-Alexander-University Erlangen-Nürnberg (FAU)

Abstract

Industrial X-ray computed tomography (XCT) is a tool for non-destructive testing and a volumetric analysis method with the ability to measure dimensions and geometry inside a component without destroying it. However, XCT is a relatively young technology in the field of dimensional metrology and thus faces several challenges. The achievement of a high measurement resolution, which is re-quired to detect small geometrical features, depends on a variety of influencing factors. In this arti-cle, the interface structural resolution (ISR) as one of the key challenges will be investigated. The two-sphere standard called the hourglass standard allows the determination of the structural resolu-tion by evaluation of the surrounding area of an ideal point contact of two spheres after the CT re-construction in form of a neck-shaped transition. Close to the contact point of the two spheres two opposing surfaces exist. Their distances from each other increase as the distance from the contact point of the two spheres increase. The determination of the distances between the spheres’ surface allows a statement about the ISR. A new developed specimen or standard with a variable gap size consisting of calibrated parallel gauge blocks allows statements about the ISR, too. Because of the higher number of probing points of the gauge block standard the results of the determined ISR are more stable compared to the hourglass standard. This paper compares the results of the computed tomography measurements for the designed interface structural resolution standard with those of the hourglass standard.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference11 articles.

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2. S. Carmignato, W. Dewulf and R. Leach, Industrial X-Ray Computed Tomography, Springer International Publishing, Cham, (2018).

3. F. A. Arenhard, C. R. Baldo, T. L. Fernandes, G. D. Donatelli, Experimental Investigation of the Influencing Factors on the Structural Resolution for Dimensional Measurements with CT Systems, in Proceedings of ICT Wels 2016, (2016).

4. A. Staude, J. Goebbels, Determining the spatial resolution in computed tomography – Comparison of MTF and line-pair structures. International symposium on digital industrial radiology and computed tomography, Berlin, 20-22 June 2011, (2011).

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