Author:
Nakagomi S.,Yokoyama K.,Kokubun Y.
Abstract
Abstract. Field-effect hydrogen gas sensor devices were fabricated with the structure of a series connection between Schottky junctions and β-Ga2O3/6H-SiC heterojunctions. β-Ga2O3 thin films were deposited on n-type and p-type 6H-SiC substrates by gallium evaporation in oxygen plasma. These devices have rectifying properties and were characterized as hydrogen sensors by a Pt electrode. The hydrogen-sensing properties of both devices were measured in the range of 300–500 °C. The Pt/Ga2O3/n-SiC device revealed hydrogen-sensing properties as conventional Schottky diode-type devices. The forward current of the Pt/Ga2O3/p-SiC device was significantly increased under exposure to hydrogen. The behaviors of hydrogen sensing of the devices were explained using band diagrams of the Pt/Ga2O3/SiC structure biased in the forward and reverse directions.
Subject
Electrical and Electronic Engineering,Instrumentation
Cited by
20 articles.
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