Author:
Germanicus Rosine Coq,Leclère Philippe,Hug Eric,Lallemand Florent,Descamps Philippe
Reference13 articles.
1. Eyben P., Vandervorst W., Alvarez D., Xu M., and Fouchier M., Scanning Probe Microscopy, Springer, New York, 31 (2007)
2. Microstructure and electrical characterization based on AFM of very high-doped polysilicon grains
3. Leyssenne L., Wane S., Massenot S., Bajon D., Coq-Germanicus R., Descamps P. and Audoit G., ICEAA 1032 (2013)
4. Leclère Ph., Viville P., Jeusette M., Aimé J.P. and Lazzaroni R., In Scanning Probe Microscopies: beyond imaging, 175 (Wiley-VCH, 2006)
5. Atomic and subnanometer resolution in ambient conditions by atomic force microscopy
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