On the correctness of mathematical models of time-of-flight cathodoluminescence of direct-gap semiconductors-Reference-Cited by-同舟云学术

On the correctness of mathematical models of time-of-flight cathodoluminescence of direct-gap semiconductors

Published:2019 Issue: Volume:30 Page:07014
ISSN:2271-2097
Container-title:ITM Web of Conferences
language:
Short-container-title:ITM Web Conf.

Author:

Stepovich Mikhail A.,Turtin Dmitry V.,Seregina Elena V.,Kalmanovich Veronika V.

Abstract

Two-dimensional and three-dimensional mathematical models of diffusion and cathodoluminescence of excitons in single-crystal gallium nitride excited by a pulsating sharply focused electron beam in a homogeneous semiconductor material are compared. The correctness of these models has been carried out, estimates have been obtained to evaluate the effect of errors in the initial data on the distribution of the diffusing excitons and the cathodoluminescence intensity.

Publisher

EDP Sciences

Subject

General Medicine

Link

https://www.itm-conferences.org/10.1051/itmconf/20193007014/pdf

Reference13 articles.

1. Mathematical Model of Qualitative Properties of Exciton Diffusion Generated by Electron Probe in a Homogeneous Semiconductor Material

2. Turtin D.V., Seregina E.V., Stepovich M.A., On the qualitative analysis of one class of differential equations of heat and mass transfer in condensed matter, Journal of Mathematical Sciences (to be published)

3. Turtin D.V., Stepovich M.A., Seregina E.V., Kalmanovich V.V., On the qualitative characteristics of a two-dimensional mathematical model of cathodoluminescence generated by a low-energy electron beam in a homogeneous semiconductor material, Journal of Mathematical Sciences (to be published)

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1. On the correctness of mathematical models of diffusion and cathodoluminescence;TAURIDA JOURNAL OF COMPUTER SCIENCE THEORY AND MATHEMATICS;2022-11-25

2. On the Simulation and Qualitative Analysis of the Diffusion Processes due to Wide Electron Beams in Homogeneous Semiconductor Targets;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2022-10