Author:
Autran Jean-Luc,Balland Bernard,Vallard Jean-Pierre,Babot Daniel
Subject
General Physics and Astronomy,General Engineering
Reference40 articles.
1. Ma T. P., Generation and transformation of interface traps in Mos structures.Microelectron. Eng.22(1993) 197-200.
2. Autran J. L., Balland B., Gaborieau L. M., Development of an interface trap measurement system using 3-level charge pumping for submicrometer MOSFETs,Ibm J Res. Development, àparaître (1994).
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