The role of dangling bonds in the properties of surfaces and interfaces of semiconductors-Reference-Cited by-同舟云学术

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The role of dangling bonds in the properties of surfaces and interfaces of semiconductors

Published:1990 Issue:9 Volume:25 Page:887-894
ISSN:0035-1687
Container-title:Revue de Physique Appliquée
language:
Short-container-title:Rev. Phys. Appl. (Paris)

Author:

Lannoo M.

Publisher

EDP Sciences

Link

http://rphysap.journaldephysique.org/10.1051/rphysap:01990002509088700/pdf

Reference37 articles.

1. Characterization of Si/SiO2 interface defects by electron spin resonance

2. ESR centers, interface states, and oxide fixed charge in thermally oxidized silicon wafers

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