Passivation des semiconducteurs III-V
Author:
Publisher
EDP Sciences
Link
http://rphysap.journaldephysique.org/10.1051/rphysap:01990002509089500/pdf
Reference75 articles.
1. Evidence for low surface recombination velocity onn‐type InP
2. Ambient gas influence on photoluminescence intensity from InP and GaAs cleaved surfaces
3. Insitumeasurements of photoluminescence intensities from cleaved (110) surfaces ofn‐type InP in a vacuum and gas ambients
Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effect of the Surface Passivation on the I‒V Characteristics of the XBn-InGaAs Focal Plane Arrays;Journal of Communications Technology and Electronics;2023-03
2. Si3N4 / SiO2 passivation layer on InP for optimization of the 1.55μm MQW FP laser performance;2009 9th International Conference on Numerical Simulation of Optoelectronic Devices;2009-09
3. Current-Voltage Measurements on Indium Phosphide Schottky Diodes;Defect and Diffusion Forum;2009-03
4. Influence of oxygen plasma on electrical and physical parameters of Au–oxide–n-InP structures;Journal of Applied Physics;2003-11-15
5. Compared rapid thermal annealing procedures of InP;Materials Science and Engineering: B;2002-03
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3