An analytical review on interfacial reactions in high-temperature die-attach: The insights into the effect of surface metallization and filler materials

Author:

Liu Canyu,Liu Changqing

Abstract

This review aims for a comprehensive insight into the interfacial reactions and the effects of surface metallization in high temperature die-attach, which is critical in governing the reliability of resultant interconnects of power electronic modules. With the emerging high-temperature filler materials, the interfacial interactions and microstructural evolutions exhibit various distinctive features, which demands detailed examination in order to identify suitable surface finishes. The metallization is not always beneficial to improving the quality and reliability of the interconnects, and consideration should also be given to the cost-effectiveness and manufacturability. The intermetallic compounds (IMCs) formed during interfacial reactions are of prime concerns for an extended discussion, together with the formation of solid solution at interfaces which can also be an important topic to explore. In this work, five commonly-encountered high temperature solder fillers are examined, including high-Pb, Au-based, Bi-Ag, Zn-Al solders and nano Ag paste, the emphasises are put on the interactions with different metallized surfaces in die-attach. The effects of metallization on interfacial reactions and formation of interfaces are discussed. Finally, the recommendations of suitable metallization are outlined to enable cost-effective and reliable interconnects for the related applications.

Publisher

EDP Sciences

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