Dislocation Contrast Analysis in Weak Beam Synchrotron X-Ray Topography

Abstract

Synchrotron monochromatic beam X-ray topography has been widely applied to characterize structural defects in SiC crystals. Using ray tracing simulations, the dislocation contrast in X-ray topography under strong diffraction conditions (diffraction takes place at or near Bragg angle) has been intensively investigated. However, the contrast and the configurations of the dislocation images recorded under weak diffraction conditions have not been fully investigated. Recently, we demonstrated that the contrast of dislocations in synchrotron grazing incidence topography under weak diffraction conditions can also be analyzed and interpreted by applying ray tracing principles. In this study, we have extended the application of the ray tracing method to analyze the dislocation contrast in weak beam synchrotron back reflection and rocking curve topography. The ray tracing method is shown to successfully simulate and correlate the contrast of threading screw dislocations at various positions on the rocking curve and thus allow to determine the signs of Burgers vectors.