Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging-Reference-Cited by-同舟云学术

Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging

Published:2015-04 Issue: Volume:88 Page:112-120
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Tsoutsouva M.G.,Oliveira V.A.,Camel D.,Baruchel J.,Marie B.,Lafford T.A.

Funder

CEA

ESRF

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference36 articles.

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2. N. Stoddard, R. Sidhu, J. Creager, S. Dey, B. Kinsey, L. Maisano, C. Phillips, R. Clark, J. Zahler, X.Q. Xie, in: Proceedings of the 34th IEEE Photovoltaic Specialists Conference, Philadelphia, PA, 2009, p. 1163.

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