Abstract
Using two highly efficient inhibitors, one for silicon and one for SiO2 and SiN it is possible by varying the hydrogenperoxide concentration to achieve tuneable formulated chemistry concerning selectivity. So, the same formulation can be used for the selective etching of SiGe25 vs. Si like for GAA applications as well as for the selective etching of SiGe40 vs. SiGe20 like for CFET applications.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics
Reference8 articles.
1. Selective Wet Etching in Fabricating SiGe and Ge Nanowires for Gate-all-Around MOSFETs;Liu;Solid State Phenomena,2018
2. SiGe Selective Etchant for Gate-all-Around Transistors, Solid State Phenomena, 2021, Vol. 314, pp.71-76
3. A Benchmark Study of Complementary-Field Effect Transistor (CFET) Process Integration Options Done by Virtual Fabrication;Vincent;IEEE Journal of the Electron Devices Society
4. 'Nanosheet-based complementary field-effect transistors (CFETs) at 48nm gate pitch, and middle dielectric isolation to enable CFET inner spacer formation and multi-Vt patterning', H. Mertens et al., VLSI (2023)
5. 'Integration of a stacked contact MOL for monolithic CFET', V. Vega-Gonzalez et al., VLSI (2023)
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