Opto-Electronic Characterisation of GaAsBi/GaAs Multiple Quantum Wells for Photovoltaic Applications

Abstract

A series of GaAsBi/GaAs multiple quantum well p-i-n diodes was grown using molecular beam epitaxy and the opto-electrical characterisations are presented. The result shows that devices experience low carrier extractions when light is absorbed due to hole trapping in the valence band. Carrier enhancement can be achieved by applying slight reverse bias when the measurement was taken. The absorption coefficient of the devices is confirmed to be similar with other Bi-based work. GaAsBi/GaAs multiple quantum well do have a lot of room for improvement especially on growth, structure and strain level of the material. If these components can be catered, GaAsBi can be a competitive alternative for 1 eV junction in multiple junction solar cells.