Affiliation:
1. Politecnico di Torino
2. IRCI-International Rectifier Corporation Italia
Abstract
We present a theoretical and experimental study on the design, fabrication and
characterization of Schottky Barrier Diodes (SBD) on commercial 4H-SiC epitaxial layers. Numerical simulations were performed with a commercial tool on different edge termination structures, with the aim of optimizing the device behavior. For each termination design, SBD were fabricated and characterized by means of electrical measurements vs. temperature. Simulations provided also useful data for the assessment of the device process technology.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference11 articles.
1. E. Bellotti et al.: J. Appl. Phys., Vol. 87, No. 8 (2000), p.3864.
2. G. L. Harris: Properties of Silicon Carbide (INSPEC, U.K. 1995).
3. M. Bakowski, U. Gustafsson, and U. Lindefelt: Phys. Stat. Sol. (a), Vol. 162 (1997), p.421.
4. M. Ikeda, H. Matsunami, and T. Tanaka: Phys. Rev. B, Vol. 22 (1980), p.2842.
5. D. M. Caughey and R. E. Thomas: Proc. IEEE, vol. 55 (1967), p.2192.
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