Annealing Study on Radiation-Induced Defects in 6H-SiC
Author:
Affiliation:
1. Universidade Federal de Minas Gerais
2. Universität-GH Paderborn
3. University of Paderborn
4. Universität Paderborn
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
https://www.scientific.net/MSF.457-460.517.pdf
Reference11 articles.
1. N.M. Pavlov, M.I. Iglitsyn, M.G. Kosaganova and V.N. Solomatin: Sov. Phys. Semicond. Vol. 9 (1976), p.845.
2. V.S. Vainer and V.A. II'in: Sov. Phys. Semicond. Vol. 23 (1981), p.2126.
3. J. Schneider and K. Maier: Physica B Vol. 185 (1993), p.199.
4. H. Itoh, M. Yoshikawa, I. Nashiyama, S. Misawara, H. Okumura and S. Yoshida: IEEE Trans. Nucl. Sci. Vol. 37 (1990), p.1732.
5. E. Sörman, N.T. Son, W.M. Chen, O. Kordina, C. Hallin and E. Janzén: Phys. Rev. B Vol. 61 (2000), p.2613.
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