1836 V, 4.7 mΩ•cm2 High Power 4H-SiC Bipolar Junction Transistor
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Published:2006-10
Issue:
Volume:527-529
Page:1417-1420
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ISSN:1662-9752
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Container-title:Materials Science Forum
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language:
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Short-container-title:MSF
Author:
Zhang Jian Hui1, Wu Jian2, Alexandrov Petre3, Burke Terry4, Sheng Kuang2, Zhao Jian Hui2
Affiliation:
1. United Silicon Carbide, Inc. 2. Rutgers University 3. United Silicon Carbide 4. U.S. Army
Abstract
This paper reports recent progress in the development of high power 4H-SiC BJTs based
on an improved device design and fabrication scheme. Near theoretical limit high blocking voltage
of VCEO=1,836 V has been achieved for 4H-SiC BJTs based on a drift layer of only 12 μm, doped to
6.7x1015 cm-3. The collector current measured for a single cell BJT with an active area of 0.61 mm2
is up to IC=9.87 A (JC=1618 A/cm2). The collector current is 7.64 A (JC=1252 A/cm2) at VCE=5.9 V
in the saturation region, corresponding to an absolute specific on-resistance (RSP_ON) of 4.7 m9·cm2.
From VCE=2.4 V to VCE= 5.8 V, the BJT has a differential RSP_ON of only 3.9 m9·cm2. The current
gain is about 8.8 at Ic=5.3 A (869 A/cm2). This 4H-SiC BJT shows a V2/RSP_ON of 717 MW/cm2,
which is the highest value reported to date for high-voltage and high-current 4H-SiC BJTs. A verylarge
area 4H-SiC BJT with an active area of 11.3 mm2 is also demonstrated.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
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