Reproducibility of a Nanometre Accurate Moving-Scale Measurement System

Abstract

A dedicated experimental setup has been designed and built up for determining the reproducibility of a 1-DOF moving-scale measurement system. A 3-DOF moving-scale system would enable the measurement of the position of a workpiece table moving in three perpendicular directions with minimized Abbe-offset. This allows normal machine tools and CMMs to match or even surpass the accuracy of ultra-precision machines. An uncertainty budget indicates that the 1-DOF moving-scale system can obtain a measurement uncertainty of 18 nm. Thermal drift is the largest contribution to the measurement uncertainty and should be accurately determined.