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Research on Noise Sources in CMOS Image Sensors

Published:2010-12 Issue: Volume:159 Page:527-531
ISSN:1662-8985
Container-title:Advanced Materials Research
language:
Short-container-title:AMR

Author:

Han Bao Yuan¹,Shang Yuan Yuan¹,Zhao Xiao Xu¹,Liu Hui¹

Affiliation:

1. Capital Normal University

Abstract

CMOS (Complementary Metal Oxide Semiconductor) imagers as a solid state array develop rapidly. This article introduces various types of CMOS image sensors’ noises in detail, the cause of each noise, as well as a brief overview of current methods for reducing different noise.

Publisher

Trans Tech Publications, Ltd.

Subject

General Engineering

Link

https://www.scientific.net/AMR.159.527.pdf

Reference9 articles.

1. Wenbo ZHAO, Jungang LIU, . Recent progress in research on CMOS image sensor. SEMICONDUCTOR OPTOELECTRONICS. 1999. 20 (1).

2. Yuanyuan Shang, Binxun Ye, Qian Song. A CMOS camera with extended dynamic range. SPIE2004. Vol. 5499: pp.414-422.

3. R.I. Hornsey, University of Waterloo, Noise in image sensors.

4. Lu SUN, Huiyuan ZHAO, Binghua SU. Design of New Type CMOS Image Sensor. MODERN ELECTRONICS TECHNIQUE. 2009, 32(16).

5. Jing LIU, Minghui DU, Imaging techniques and development status for CMOS image sensors, JOURNAL OF TRANSDUCER TECHNOLOGY, 2004 23(11).

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1. Bayesian multilevel random‐effects model for estimating noise in image sensors;IET Image Processing;2020-09-04

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