Bayesian multilevel random‐effects model for estimating noise in image sensors-Reference-Cited by-同舟云学术

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Bayesian multilevel random‐effects model for estimating noise in image sensors

Published:2020-09-04 Issue:12 Volume:14 Page:2737-2745
ISSN:1751-9659
Container-title:IET Image Processing
language:en
Short-container-title:IET image process

Author:

Riutort‐Mayol Gabriel¹^ORCID,Gómez‐Rubio Virgilio²,Marqués‐Mateu Ángel¹^ORCID,Lerma José Luis¹,López‐Quílez Antonio³

Affiliation:

1. Department of Cartographic Engineering, Geodesy, PhotogrammetryUniversitat Politècnica de ValènciaValènciaSpain

2. Department of MathematicsUniversidad de Castilla‐La ManchaAlbaceteSpain

3. Department of Statistics, Operations ResearchUniversitat de ValènciaBurjassotSpain

Funder

Instituto de Salud Carlos III

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Computer Vision and Pattern Recognition,Signal Processing,Software

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-ipr.2018.5926

Reference45 articles.

1. Essential Principles of Image Sensors

2. Noise analysis and measurement of time delay and integration charge coupled device

3. CCD or CMOS camera noise characterisation

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