Charge Collection Efficiency of 6H-SiC P+N Diodes Degraded by Low-Energy Electron Irradiation

Author:

Iwamoto Naoya1,Onoda Shinobu1,Ohshima Takeshi1,Kojima Kazutoshi2,Koizumi Atsushi3,Uchida Kazuo3,Nozaki Shinji3

Affiliation:

1. QST

2. National Institute of Advanced Industrial Science and Technology (AIST)

3. The University of Electro-Communications

Abstract

The effect of electron irradiation on the charge collection efficiency of a 6H-SiC p+n diode has been studied. The diodes were irradiated with electrons of energies from 100 keV to 1 MeV. The charge collection efficiencies of the samples were measured for alpha particles before and after the electron irradiation. The electron irradiation at 100 keV does not affect the charge collection efficiency, while the electron irradiation at 200 keV or higher decreases the charge collection efficiency. The degree of the degradation of the diodes correlates with the energy of the electron irradiation.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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